Kocak, H. M. Et Al. 2024. Machine Learning Based Universal Threshold Voltage Extraction of Transistors Using Convolutional Neural Networks. IEEE Transactions on Semiconductor Manufacturing , vol.37, no.4 , 615-619.

Kocak, H. M., Davis, J., Houssa, M., NASKALİ, A. T., & Mitard, J., (2024). Machine Learning Based Universal Threshold Voltage Extraction of Transistors Using Convolutional Neural Networks. IEEE Transactions on Semiconductor Manufacturing , vol.37, no.4, 615-619.

Kocak, Husnu Et Al. "Machine Learning Based Universal Threshold Voltage Extraction of Transistors Using Convolutional Neural Networks," IEEE Transactions on Semiconductor Manufacturing , vol.37, no.4, 615-619, 2024

Kocak, Husnu M. Et Al. "Machine Learning Based Universal Threshold Voltage Extraction of Transistors Using Convolutional Neural Networks." IEEE Transactions on Semiconductor Manufacturing , vol.37, no.4, pp.615-619, 2024

Kocak, H. M. Et Al. (2024) . "Machine Learning Based Universal Threshold Voltage Extraction of Transistors Using Convolutional Neural Networks." IEEE Transactions on Semiconductor Manufacturing , vol.37, no.4, pp.615-619.

@article{article, author={Husnu Murat Kocak Et Al. }, title={Machine Learning Based Universal Threshold Voltage Extraction of Transistors Using Convolutional Neural Networks}, journal={IEEE Transactions on Semiconductor Manufacturing}, year=2024, pages={615-619} }