Kocak, H. M. Et Al. 2021. Detecting Transistor Defects in Medical Systems Using a Multi Model Ensemble of Convolutional Neural Networks. 2021 IEEE International Conference on Big Data, Big Data 2021 , (Virtual, Online, United States Of America), 4731-4737.

Kocak, H. M., NASKALİ, A. T., PINARER, Ö., & Mitard, J., (2021). Detecting Transistor Defects in Medical Systems Using a Multi Model Ensemble of Convolutional Neural Networks . 2021 IEEE International Conference on Big Data, Big Data 2021 (pp.4731-4737). Virtual, Online, United States Of America

Kocak, Hüsnü Et Al. "Detecting Transistor Defects in Medical Systems Using a Multi Model Ensemble of Convolutional Neural Networks," 2021 IEEE International Conference on Big Data, Big Data 2021, Virtual, Online, United States Of America, 2021

Kocak, Hüsnü M. Et Al. "Detecting Transistor Defects in Medical Systems Using a Multi Model Ensemble of Convolutional Neural Networks." 2021 IEEE International Conference on Big Data, Big Data 2021 , Virtual, Online, United States Of America, pp.4731-4737, 2021

Kocak, H. M. Et Al. (2021) . "Detecting Transistor Defects in Medical Systems Using a Multi Model Ensemble of Convolutional Neural Networks." 2021 IEEE International Conference on Big Data, Big Data 2021 , Virtual, Online, United States Of America, pp.4731-4737.

@conferencepaper{conferencepaper, author={Hüsnü Murat Kocak Et Al. }, title={Detecting Transistor Defects in Medical Systems Using a Multi Model Ensemble of Convolutional Neural Networks}, congress name={2021 IEEE International Conference on Big Data, Big Data 2021}, city={Virtual, Online}, country={United States Of America}, year={2021}, pages={4731-4737} }