Kocak, H. M. Et Al. 2022. Combined Machine Learning Techniques for Characteristics Classification and Threshold Voltage Extraction of Transistors. 34th IEEE International Conference on Microelectronic Test Structures, ICMTS 2022 , (Ohio, United States Of America).

Kocak, H. M., Mitard, J., & NASKALİ, A. T., (2022). Combined Machine Learning Techniques for Characteristics Classification and Threshold Voltage Extraction of Transistors . 34th IEEE International Conference on Microelectronic Test Structures, ICMTS 2022, Ohio, United States Of America

Kocak, Husnu, Jerome Mitard, And AHMET TEOMAN NASKALİ. "Combined Machine Learning Techniques for Characteristics Classification and Threshold Voltage Extraction of Transistors," 34th IEEE International Conference on Microelectronic Test Structures, ICMTS 2022, Ohio, United States Of America, 2022

Kocak, Husnu M. Et Al. "Combined Machine Learning Techniques for Characteristics Classification and Threshold Voltage Extraction of Transistors." 34th IEEE International Conference on Microelectronic Test Structures, ICMTS 2022 , Ohio, United States Of America, 2022

Kocak, H. M. Mitard, J. And NASKALİ, A. T. (2022) . "Combined Machine Learning Techniques for Characteristics Classification and Threshold Voltage Extraction of Transistors." 34th IEEE International Conference on Microelectronic Test Structures, ICMTS 2022 , Ohio, United States Of America.

@conferencepaper{conferencepaper, author={Husnu Murat Kocak Et Al. }, title={Combined Machine Learning Techniques for Characteristics Classification and Threshold Voltage Extraction of Transistors}, congress name={34th IEEE International Conference on Microelectronic Test Structures, ICMTS 2022}, city={Ohio}, country={United States Of America}, year={2022}}