IIE TRANSACTIONS, vol.33, no.12, pp.1093-1108, 2001 (SCI-Expanded)
We consider the component testing problem of a series system with redundant subsystems where all components fail exponentially. The main feature of our model is that the component failure rates are not constant parameters, but in fact change in a dynamic fashion with respect to time. The optimal component testing problem is formulated as a semi-infinite linear program. We present an algorithmic procedure to compute optimal test times based on the column generation technique, and illustrate it with numerical results.